The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Feb. 08, 2008
Andreas Hecker, Asslar, DE;
Andreas Hecker, Asslar, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy is described. A first light source emits conventional fluorescent illumination light along a first illumination path and a second light source emitting evanescent illumination light along a second illumination path that differs from the first illumination path. An objective emits light onto an object to be viewed. A beam combiner directs the two lights into the objective while keeping their beam paths geometrically separated. The beam combiner comprises at least two spatially separated first zones for coupling in the conventional fluorescent illumination light and at least two spatially separated second zones for coupling in the evanescent illumination light. The first and second zones are adapted in their size and position to objective pupils of different objectives.