The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Nov. 12, 2009
Jiubin Tan, Harbin, CN;
Fei Wang, Harbin, CN;
Jiwen Cui, Harbin, CN;
Harbin Institute of Technology, Heilongjiang, CN;
Abstract
A micro-cavity measuring method and equipment based on micro focal-length collimation are provided. The equipment can be used to measure irregular micro-cavities and 'sub-macro' micro-cavities. Wherein a cylindrical or spherical lens with micro focal-length is combined with a fiber probe() to form a collimating and imaging optical system of a point light source(), and the collimating and imaging optical system transforms the two or three dimensional movement of the fiber probe() into a change in image ultra-highly sensitively. A lot of advantages are obtained, i.e., micro measuring force, high aspect ratio, easy miniaturization, high resolution, simple construction and high speed.