The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Jul. 27, 2012
Mark Alan Lemkin, Berkeley, CA (US);
Thor Nelson Juneau, Menlo Park, CA (US);
Mark Alan Lemkin, Berkeley, CA (US);
Thor Nelson Juneau, Menlo Park, CA (US);
Dust Networks, Inc., Hayward, CA (US);
Abstract
Phase noise in a first clock signal is measured using a time to digital converter (TDC) by determining variations in the phase delay between the first clock signal and a second clock signal. The TDC can include first and second series interconnections of delay elements, first and second sets of latches, and processing circuitry coupled to the latches and configured to determine the phase delay. The TDC can include a series interconnection of delay elements, latches, and circuitry configured to selectively adjust the control signal connected to the delay elements based on the output of the latches. The phase noise measurement can be used in a sampling circuit, so as to produce a second data signal from a first data signal based on the first clock signal and the measured phase noise.