The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Dec. 16, 2009
Kenneth A. Ostrom, Palos Verdes Estates, CA (US);
Richard Pierson, Newport Beach, CA (US);
Benjamim Tang, Rancho Palos Verdes, CA (US);
Clark Custer, Torrance, CA (US);
Scott Southwell, Seal Beach, CA (US);
Felix Kim, Plano, TX (US);
Kenneth A. Ostrom, Palos Verdes Estates, CA (US);
Richard Pierson, Newport Beach, CA (US);
Benjamim Tang, Rancho Palos Verdes, CA (US);
Clark Custer, Torrance, CA (US);
Scott Southwell, Seal Beach, CA (US);
Felix Kim, Plano, TX (US);
Infineon Technologies Austria AG, Villach, AT;
Abstract
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.