The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Sep. 24, 2010
Daniel K. Chappell, Greenwood, IN (US);
Richard Earl Jones, Jr., Plainfield, IN (US);
Eddie B. Gaines, Plainfield, IN (US);
Daniel K. Chappell, Greenwood, IN (US);
Richard Earl Jones, Jr., Plainfield, IN (US);
Eddie B. Gaines, Plainfield, IN (US);
JDS Uniphase Corporation, Milpitas, CA (US);
Abstract
A method of characterizing a wiring network is implemented in a system which includes a test controller and at least two probes. On commands from the test controller, at least one of the probes changes its impedance between the nominal impedance of the wiring network and a mismatch impedance. Reflectometry measurements are performed before and after of switching the impedance of the second probe. At the first probe, an RF signal is generated and a reflected signal is measured. Then, the impedance of the second probe is changed, and again an RF signal is generated and a reflected signal is measured at the first probe. Additionally, a frequency response may be measured at the second probe. The results of the measurements are used for characterization of a transmission line between the first and second probes.