The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Dec. 12, 2011
Applicants:
Atsushi Koyata, Tokyo, JP;
Hiroyuki Yokoi, Tokyo, JP;
Inventors:
Atsushi Koyata, Tokyo, JP;
Hiroyuki Yokoi, Tokyo, JP;
Assignee:
Mitsubishi Chemical Medience Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/75 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of determining a kind of a sample, in a method for analyzing a substance by the steps of supplying the sample to be analyzed to a reaction system by a supplying means comprising a transparent region composed of a transparent material, reacting a reagent for detecting the substance with the sample in the reaction system, and analyzing a signal derived from a product obtained by the reaction, characterized by irradiating the transparent region with light in the supplying step, and analyzing an optical intensity of the light.