The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Jan. 31, 2007
Noriyuki Suto, Kanagawa-Ken, JP;
Kenichi Kimura, Odawara, JP;
Noriyuki Suto, Kanagawa-Ken, JP;
Kenichi Kimura, Odawara, JP;
National Printing Bureau, Incorporated Administrative Agency, Tokyo-To, JP;
Abstract
This invention provides an information recording patch that allows accurate authenticity discrimination, a printed sheet, and an authenticity discrimination method therefor. An information recording patch includes a protective layer (), intermediate layer (), metal layer (), and adhesive layer (). The protective layer () made of a material having a predetermined dielectric constant is arranged at the uppermost layer. The intermediate layer () made of a material having a predetermined dielectric constant has, on its surface, a three-dimensional pattern corresponding to the design of a hologram forming layer including the intermediate layer and the metal layer. The metal layer () made of a material having a predetermined conductivity is arranged on the three-dimensional surface of the intermediate layer to form a conductive film. A mirror surface having a three-dimensional pattern, which is formed by the metal layer and the intermediate layer, serves as the main component of the image of the hologram forming layer. The adhesive layer () made of a material having a predetermined dielectric constant has the characteristic of a dielectric of itself. When this information recording patch was measured using a leakage microwave sensor, the detected voltage exhibited 'medium level' in the conductive region of the metal layer and 'low level' in the remaining regions.