The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Jan. 19, 2010
Applicants:
Takeshi Yasuie, Kawasaki, JP;
Yuji Nomura, Kawasaki, JP;
Taichi Sugiyama, Kawasaki, JP;
Inventors:
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract
An abnormal point locating method includes: a link primary abnormality judgment procedure that acquires information on a link through which each observation flow passes, locates a link through which an observation flow observed at an observation point passes, and judges whether the located link is normal or abnormal based on the observation flow; and a link secondary abnormality judgment procedure that judges a probability of abnormality based on a result of the link primary abnormality judgment procedure by using a connection relationship as seen from each observation point.