The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

Dec. 03, 2010
Applicants:

Tapas Kanungo, Redmond, WA (US);

Kuansan Wang, Bellevue, WA (US);

Ran Gilad-bachrach, Bellevue, WA (US);

Kieran Mcdonald, Seattle, WA (US);

Kumaresh Pattabiraman, Redmond, WA (US);

Christopher Meyers, Kirkland, WA (US);

Ashok Ponnuswami, Redmond, WA (US);

Luke Simon, Redmond, WA (US);

Inventors:

Tapas Kanungo, Redmond, WA (US);

Kuansan Wang, Bellevue, WA (US);

Ran Gilad-Bachrach, Bellevue, WA (US);

Kieran McDonald, Seattle, WA (US);

Kumaresh Pattabiraman, Redmond, WA (US);

Christopher Meyers, Kirkland, WA (US);

Ashok Ponnuswami, Redmond, WA (US);

Luke Simon, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

This patent application pertains to answer model comparison. One implementation can determine a first frequency at which an individual answer category appears in an individual slot on a query results page when utilizing a first model. The method can ascertain a second frequency at which the individual answer category appears in the individual slot on the query results page when utilizing a second model. The method can calibrate the second model so that the second frequency approaches the first frequency.


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