The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Nov. 30, 2007
Yuri Mirgorodski, Sunnyvale, CA (US);
Peter J. Hopper, San Jose, CA (US);
William French, San Jose, CA (US);
Philipp Lindorfer, San Jose, CA (US);
Yuri Mirgorodski, Sunnyvale, CA (US);
Peter J. Hopper, San Jose, CA (US);
William French, San Jose, CA (US);
Philipp Lindorfer, San Jose, CA (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method of simulating an integrated circuit device under test (DUT) is provided, wherein the DUT includes a plurality of terminals. For each terminal of the DUT, a probe pulse is applied to the terminal and a reaction is recorded at the terminal and each of the other terminals to obtain values representative of reactive tails for the terminal. For each terminal, the values representative of the reactive tails obtained for the terminal are stored as an entry of a look-up table. Each entry includes n+x fields, wherein n represents a number of arguments in the entry and x represents a number of functions in the entry. For each terminal, a signal value at a selected time step is calculated.