The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Apr. 21, 2009
Günter Schallmoser, Ruhstorf, DE;
Karl Wisspeintner, Ortenburg, DE;
Robert Wagner, Neuburg am Inn, DE;
Günter Schallmoser, Ruhstorf, DE;
Karl Wisspeintner, Ortenburg, DE;
Robert Wagner, Neuburg am Inn, DE;
Micro-Epsilon Messetechnik GmbH, Orgenburg, DE;
Abstract
A method for calibration of a thickness gauge is provided in which the thickness gauge measures the thickness of a measured object in a stipulated measurement direction with at least one displacement sensor, operating contactless or by scanning, a reference object with known thickness and shape being brought into at least one partial area of the measurement field of the at least one displacement sensor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile