The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

Jan. 19, 2011
Applicants:

Christoph Mack, Seattle, WA (US);

Marina Kuznetsova, Brier, WA (US);

Scott Votaw, Brier, WA (US);

Robert Snook, Kenmore, WA (US);

Inventors:

Christoph Mack, Seattle, WA (US);

Marina Kuznetsova, Brier, WA (US);

Scott Votaw, Brier, WA (US);

Robert Snook, Kenmore, WA (US);

Assignee:

X2 Biosystems, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for head impact injury prediction. A computer implemented method is provided for event based injury predictions. The computer implemented method receives an indication of sensor data related to an impact of a user. The received sensor data is compared to previously stored sensor data in a data store. Each instance of the previously stored sensor data is associated with a medical diagnosis. If the received sensor data matches any of the previously stored sensor data based on the comparison, then an injury risk indicator is generated based on at least one of the medical diagnosis associated with the matching previously stored sensor data or an impact history of the user. The generated indicator is presented.


Find Patent Forward Citations

Mack, Christoph. (2013). Head impact analysis and comparison system (U.S. Patent No. 8554495). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8554495

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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