The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Jan. 04, 2006
Ki-eun Kim, Seoul, KR;
Kyung-hee Park, Seoul, KR;
Jung-joo Hwang, Suwon-si, KR;
Jae-heup Kim, Hwaseong-si, KR;
Yeon-su Lee, Goyang-si, KR;
Kyusang Lee, Suwon-si, KR;
Ki-eun Kim, Seoul, KR;
Kyung-Hee Park, Seoul, KR;
Jung-joo Hwang, Suwon-si, KR;
Jae-Heup Kim, Hwaseong-si, KR;
Yeon-Su Lee, Goyang-si, KR;
Kyusang Lee, Suwon-si, KR;
Abstract
Provided are a method and apparatus for analyzing genotype data plotted in a two-dimensional space. The method includes: connecting points representing the genotype data to a predetermined point to form straight lines and obtaining angles between adjacent straight lines; extracting the two largest angles from the obtained angles; and analyzing the plotted genotype data using three groups of the genotype data separated by the two extracted largest angles. According to the present invention, when the experimental results of classifying genotype are to be analyzed, the two largest angles from the angles obtained by connecting straight lines between points representing each of the genotype data and a predetermined point plotted in a two-dimensional space are detected, and three data regions separated by the detected two largest angles are used to analyze the genotype data. Thus, a large amount of the experimental data for classifying the genotype can be analyzed rapidly and conveniently.