The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Dec. 03, 2010
Young Geun Cho, Palo Alto, CA (US);
Aditya Dua, Santa Clara, CA (US);
Feng LU, Sunnyvale, CA (US);
Gokhan Mergen, Sunset Valley, TX (US);
Subramanya P. N. Rao, Sunnyvale, CA (US);
Abhinav Gupta, San Jose, CA (US);
Parvathanathan Subrahmanya, Sunnyvale, CA (US);
Young Geun Cho, Palo Alto, CA (US);
Aditya Dua, Santa Clara, CA (US);
Feng Lu, Sunnyvale, CA (US);
Gokhan Mergen, Sunset Valley, TX (US);
Subramanya P. N. Rao, Sunnyvale, CA (US);
Abhinav Gupta, San Jose, CA (US);
Parvathanathan Subrahmanya, Sunnyvale, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods and apparatuses for data aided channel quality estimation using both pilot and data information are disclosed herein. In one exemplary aspect, a method for estimating channel quality in a wireless communication system is disclosed. The method comprises estimating a pilot noise variance based on a pilot signal received from a base station on a downlink and estimating a data noise variance based on a data signal received from the base station on the downlink. The method also comprises combining the pilot noise variance and the data noise variance to obtain a combined noise variance, and estimating the channel quality based on the combined noise variance.