The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Jun. 23, 2010
Kuo-tang Huang, Hsinchu, TW;
Bor-tung Jiang, Hsinchu, TW;
Shang-chieh LU, Hsinchu, TW;
Po-huang Shieh, Hsinchu, TW;
Kuo-Tang Huang, Hsinchu, TW;
Bor-Tung Jiang, Hsinchu, TW;
Shang-Chieh Lu, Hsinchu, TW;
Po-Huang Shieh, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A method and system for measuring three-dimensional coordinates of an object are provided. The method includes: capturing images from a calibration point of known three-dimensional coordinates by two image-capturing devices disposed in a non-parallel manner, so as for a processing module connected to the image-capturing devices to calculate a beam confluence collinear function of the image-capturing devices; calibrating the image-capturing devices to calculate intrinsic parameters and extrinsic parameters of the image-capturing devices and calculate the beam confluence collinear function corresponding to the image-capturing devices; and capturing images from a target object by the image-capturing devices so as for the processing module to calculate three-dimensional coordinates of the object according to the beam confluence collinear function. In so doing, the method and system enable the three-dimensional coordinates and bearings of a target object to be calculated quickly, precisely, and conveniently. Hence, the method and system are applicable to various operating environments.