The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Jul. 20, 2009
Yang-ming Zhu, Solon, OH (US);
Steven M. Cochoff, Hudson, OH (US);
Cheng-hsiu Chen, Hudson, OH (US);
Yang-Ming Zhu, Solon, OH (US);
Steven M. Cochoff, Hudson, OH (US);
Cheng-Hsiu Chen, Hudson, OH (US);
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
In image registration, a similarity measure is computed of first and second images () offset at a plurality of relative axial offsets (). A starting relative axial offset () between the first and second images is identified based on the computed similarity measures. An iterative image registration process is performed to relatively register the first and second images () using the identified starting relative axial offset between the first and second images as an initial condition for the iterative image registration process. A starting relative in-slice offset () may also be identified as an in-slice offset effective to align corresponding slices of the first and second images () offset at the starting relative axial offset (), the identified starting relative in-slice offset also being used as an initial condition for the iterative image registration process.