The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

May. 30, 2007
Applicants:

Murali Kumaran Kariathungal, Hoffman Estates, IL (US);

Prakash Mahesh, Hoffman Estates, IL (US);

Mark M. Morita, Arlington Heights, IL (US);

Inventors:

Murali Kumaran Kariathungal, Hoffman Estates, IL (US);

Prakash Mahesh, Hoffman Estates, IL (US);

Mark M. Morita, Arlington Heights, IL (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Certain embodiments of the present invention provide a method for radiological imaging including: viewing a study, the study including a series of radiological images interfacing with the study to allow interaction with the radiological images of the study; selecting an image from the series of radiological images to form an event marker; and


Find Patent Forward Citations

Kariathungal, Murali. (2013). Methods and systems for grouping radiological images into event markers (U.S. Patent No. 8553951). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8553951

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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