The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Mar. 06, 2007
Hitoshi Kiya, Hino, JP;
Kiyoshi Nishikawa, Hino, JP;
Masaaki Fujiyoshi, Hino, JP;
Yoichi Hata, Yokohama, JP;
Toshiaki Kakii, Yokohama, JP;
Yoshimitsu Goto, Yokohama, JP;
Hitoshi Kiya, Hino, JP;
Kiyoshi Nishikawa, Hino, JP;
Masaaki Fujiyoshi, Hino, JP;
Yoichi Hata, Yokohama, JP;
Toshiaki Kakii, Yokohama, JP;
Yoshimitsu Goto, Yokohama, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Tokyo Metropolitan University, Tokyo, JP;
Abstract
The present invention relates to an image processing method and image inspecting method with high versatility which enable efficient and highly accurate proof of authenticity of a digital image. The image processing method subjects at least a part of a digital image which can exist temporarily or continuously in a falsification-vulnerable environment, to a first morphology operation using a predetermined structuring element, to process the digital image. The image inspecting method subjects the digital image thus processed, to a second morphology operation using the same structuring element as in the first morphology operation. The morphology operations have the idempotent and the presence or absence of falsification can be detected by determining identity of images before and after the second morphology operation.