The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Aug. 03, 2012
Applicant:
Feng MA, Cary, NC (US);
Inventor:
Feng Ma, Cary, NC (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An imaging system and method configured to construct an image of an internal structure of an object. The imaging system including: a radiation source configured to generate both a narrow beam and a wide beam of radiation; a detector configured to detect the radiation; and at least one processing circuit configured to: determine a scatter-to-primary ratio (SPR) of the wide beam based on the narrow beam; determine a primary component of the wide beam based on the SPR to thereby separate the primary component from a scattered component of the wide beam; and construct the image using the primary component.