The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Oct. 27, 2008
Motohiro Furuki, Tokyo, JP;
Shingo Imanishi, Kanagawa, JP;
Masataka Shinoda, Tokyo, JP;
Akitoshi Suzuki, Shizuoka, JP;
Kazushi Miyake, Tokyo, JP;
Motohiro Furuki, Tokyo, JP;
Shingo Imanishi, Kanagawa, JP;
Masataka Shinoda, Tokyo, JP;
Akitoshi Suzuki, Shizuoka, JP;
Kazushi Miyake, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.