The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

May. 26, 2008
Applicant:

Kikuhito Kawasue, Miyazaki, JP;

Inventor:

Kikuhito Kawasue, Miyazaki, JP;

Assignee:

University of Miyazaki, Miyazaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distortion inspecting apparatus, which inspects perspective distortion of a transparent object, includes a projector that projects a plurality of display points arranged at predetermined intervals, a screen that displays an image projected by the projector thereon and allows the image to pass therethrough, a pedestal that disposes the transparent object at a position where the image passed through the screen, a camera that captures the image that passed through the transparent object, and a control device that stores a reference position coordinate of the image that passed through a reference transparent object, compares the reference position coordinate with an inspection position coordinate of the image that passed through the transparent object as an object to be inspected, and calculates a displacement quantity of the reference position coordinate.


Find Patent Forward Citations

Loading…