The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Dec. 10, 2008
Applicants:
Peter Ying Kay Cheung, London, GB;
Nicholas Peter Sedcole, Isey-les-Moulineaux, FR;
Justin Sung-jit Wong, London, GB;
Inventors:
Peter Ying Kay Cheung, London, GB;
Nicholas Peter Sedcole, Isey-les-Moulineaux, FR;
Justin Sung-Jit Wong, London, GB;
Assignee:
Maxeler Technologies Limited, London, GB;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/12 (2006.01); G01R 23/175 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract
A method of measuring signal delay in a integrated circuit comprising applying a common clock signal at a circuit input and output, applying a test signal at the circuit input, detecting a corresponding output signal at the circuit output and detecting whether the test signal and output signal occur in a common part of the clock signal.