The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Sep. 15, 2009
Heinz Walter Joseph, Freiburg, DE;
Nicolas Lembert, Reutlingen, DE;
Heinz Walter Joseph, Freiburg, DE;
Nicolas Lembert, Reutlingen, DE;
Tetec Tissue Engineering Technologies AG, Reutlingen, DE;
Abstract
Methods for in-vitro analysis of biological cells and/or microorganisms to determine characteristics such as: degree of differentiation, cell type, donor individuals, culture conditions, purity, lack of natural characteristic, or additional characteristics in comparison to natural characteristics. The methods include the steps of: (a) projecting infrared radiation on a sample; (b) recording spectral characteristics of the sample; (c) deriving a Fourier transform infrared spectrum (FT-IR) from the collected spectral characteristics; (d) generating a derivative transformation of the FT-IR spectrum; (e) comparing said derivative transformation with a derivative of a reference FT-IR spectrum; (f) identifying deviations of said derivative from said reference derivative; and (g) providing an analysis of said characteristics based on the presence of said deviations. In addition, the invention relates to an apparatus for carrying out the disclosed methods.