The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Jun. 21, 2011
Gert Koest, Hannover, DE;
Andreas Steinmueller, Wettenberg, DE;
Gert Koest, Hannover, DE;
Andreas Steinmueller, Wettenberg, DE;
Oculus Optikgeraete GmbH, Wetzlar-Dutenhofen, DE;
Abstract
The invention relates to an opthalmological analysis method for measuring an intraocular pressure in an eye with an analysis system consisting of an actuating device, wherein the actuating device causes a puff of air to be applied to the eye in such manner that the cornea is deformed, an observation system with which the deformation of the cornea is observed and recorded, wherein sectional images of the cornea when it is deformed and not deformed are created with the observation device, and an analysis device with which the intraocular pressure is derived from the sectional images of the cornea, wherein a material characteristic of the cornea is derived from the sectional images of the cornea in the analysis device, wherein a diameter dof a first applanation area of the cornea and a diameter dof a deformation area of the cornea is derived as a material characteristic.