The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8550708 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 08, 2013

Filed:

Jun. 29, 2011
Applicants:

Ling-yu Xie, Shenzhen, CN;

Xing-ping Xie, Shenzhen, CN;

Inventors:

Ling-Yu Xie, Shenzhen, CN;

Xing-Ping Xie, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01); G01K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus for a thermal resistor includes a control device, a temperature processing circuit, a voltage regulating circuit and a temperature detecting circuit. The control device stores a plurality of predetermined voltage values and outputs control signals according to those predetermined values. The temperature processing circuit receives the control signals and outputs a pulse width modulation (PWM) signal according to the control signal. The voltage regulating circuit receives the PWM signal and outputs a first direct current (DC) voltage to heat the thermal resistor. The temperature detecting circuit detects temperature signals and current signals from the thermal resistor. The control device receives the temperature signals and current signals of the thermal resistor and generates a resistance-temperature graph of the thermal resistor.


Find Patent Forward Citations

Xie, Ling-Yu. (2013). Thermal resistor test apparatus (U.S. Patent No. 8550708). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8550708

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