The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Oct. 29, 2010
Gregory M. Nygaard, Clarkston, MI (US);
David A. Strickland, Davisburg, MI (US);
Gregory M. Nygaard, Clarkston, MI (US);
David A. Strickland, Davisburg, MI (US);
GII Acquisition, LLC, Davisburg, MI (US);
Abstract
A method and system for centering and aligning manufactured parts of various sizes at an optical measurement station are provided. The system includes apparatus having a central axis substantially parallel to the measurement axis and including a plurality of members having open and closed positions. The members have holding faces which are substantially equidistant from the central axis during movement between the open and closed positions. At least one of the members applies a force on an exterior side surface of a part disposed between the holding faces during movement between the positions to reposition the part at the station. The repositioned part is centered and aligned with respect to the measurement axis at the station. The holding faces releasably hold the repositioned part in a holding position between the open and closed positions at the station. The system further includes a movable stage subsystem coupled to the apparatus for translating the apparatus relative to the repositioned part along the central axis in the open position of the members to allow the exterior side surface of the repositioned part to be measured.