The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2013
Filed:
Oct. 27, 2010
James Ryan, Powell, OH (US);
Alexander Hutter, Plain City, OH (US);
James Ryan, Powell, OH (US);
Alexander Hutter, Plain City, OH (US);
Honda Motor Co., Ltd., Tokyo, JP;
Abstract
The apparatus and methods disclosed may be utilized for the scratch/mar testing of various materials and components that provide improved correlation between the simulated damage modes and those reasonably expected to be encountered by the final components. The apparatus includes both a fixture configured for receiving and holding the material under test (MUT) and a tool holder that is arranged and configured for supporting and holding a variety of test tools in one or more orientations relative to the MUT. The tool holder and/or the fixture are, in turn, supported by one or more assemblies arranged and configured for bringing the tool into contact with the MUT and providing for movement of the tool relative to the MUT. The apparatus is then used for collecting data from a series of tests that can be used to compare the performance of different MUT compositions and configurations.