The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2013

Filed:

Dec. 22, 2011
Applicant:

Fu-qin Xie, New Taipei, TW;

Inventor:

Fu-Qin Xie, New Taipei, TW;

Assignee:

Wistron Corporation, Hsichih, New Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring tool includes a tool body and a first measuring unit. The first measuring unit includes a first probe, a first measuring meter, and a first zero button. The first probe is used for contacting a standard part or a test part inside the tool body. The first measuring meter is connected to the first probe for displaying a first zero value or a first measure value. The first zero button is used for zeroing the first measuring meter to display the first zero value when the first probe contacts the standard part. When the first probe contacts the test part after the first measuring meter is zeroed, the first measuring meter displays the first measure value. A first dimension difference value of the test part and the standard part is equal to a difference value of the first measure value and the first zero value.


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