The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Aug. 23, 2011
Applicants:

Hiroshige Hayashizaki, Kanagawa-ken, JP;

Hiroshi Inoue, Kanagawa-ken, JP;

Peng Wu, Mt. Kisco, NY (US);

Inventors:

Hiroshige Hayashizaki, Kanagawa-ken, JP;

Hiroshi Inoue, Kanagawa-ken, JP;

Peng Wu, Mt. Kisco, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

Integrated trace selection and profiling in dynamic optimizers may include selecting a trace head based on profile of basic blocks that are executed. The basic blocks executed from the trace head may be recorded as a trace. The trace may be added to a trace nursery in non-compiled state. The trace may be interpreted and profiled until the trace matures. Under a profiling mode, path sensitive runtime information such as values, types, targets of call-sites, and exit frequencies can be collected. The trace may be moved out of the nursery to a compilation queue in response to determining that the trace has matured based on an execution count of the profiled trace.


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