The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Nov. 18, 2009
Ingeol Chun, Seoul, KR;
Taeho Kim, Gyeonggi-do, KR;
Chaedeok Lim, Daejeon, KR;
Seungmin Park, Daejeon, KR;
Ingeol Chun, Seoul, KR;
Taeho Kim, Gyeonggi-do, KR;
Chaedeok Lim, Daejeon, KR;
Seungmin Park, Daejeon, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
Provided is to an apparatus for application testing of an embedded system which can cross-develop an application program installed in the embedded system regardless of the type of a target system. A virtual environment for testing the application program adopted in the target system is constructed on the basis of information inputted through a user interface and the application program is tested by configuring a virtual target system in the constructed virtual environment. According to the present invention, the application program adopted in the target system can be developed and tested without constructing a cross-development environment for each target system in an environment in which various kinds of embedded systems are developed.