The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8549465 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 01, 2013

Filed:

Feb. 28, 2012
Applicants:

Corville O. Allen, Morrisville, NC (US);

Albert A. Chung, Cary, NC (US);

Binh C. Truong, Cary, NC (US);

Kam K. Yee, Apex, NC (US);

Inventors:

Corville O. Allen, Morrisville, NC (US);

Albert A. Chung, Cary, NC (US);

Binh C. Truong, Cary, NC (US);

Kam K. Yee, Apex, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention address deficiencies of the art in respect to defect classification for software development and provide a method, system and computer program product for automated defect classification in a software development tool. In an embodiment of the invention, a defect classification method can be provided. The method can include computing differences between versions of a line of source code, lexically analyzing the computed differences to produce a lexical construct, mapping the lexical construct to a classification, and assigning the defect classification to the line of source code.


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