The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Jun. 24, 2010
Applicants:

Luiz C. Alves, Hopewell Junction, NY (US);

Luis A. Lastras-montano, Cortlandt Manor, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

Eldee Stephens, Waterbury, CT (US);

Barry M. Trager, Yorktown Heights, NY (US);

Inventors:

Luiz C. Alves, Hopewell Junction, NY (US);

Luis A. Lastras-Montano, Cortlandt Manor, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

Eldee Stephens, Waterbury, CT (US);

Barry M. Trager, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Error correction and detection in a redundant memory system including a a computer implemented method that includes receiving data including error correction code (ECC) bits, the receiving from a plurality of channels, each channel comprising a plurality of memory devices at memory device locations. The method also includes computing syndromes of the data; receiving a channel identifier of one of the channels; and removing a contribution of data received on the channel from the computed syndromes, the removing resulting in channel adjusted syndromes. The channel adjusted syndromes are decoded resulting in channel adjusted memory device locations of failing memory devices, the channel adjusted memory device locations corresponding to memory device locations.


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