The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
May. 26, 2011
Applicant:
Christian Haufe, Dresden, DE;
Inventor:
Christian Haufe, Dresden, DE;
Assignee:
GLOBALFOUNDRIES, Inc., Grand Cayman, KY;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A semiconductor-based test device includes a plurality of testing clusters and a pseudorandom global stimulus source coupled to the testing clusters. Each testing cluster includes a plurality of data registers and logic elements configured to perform random logic functions for generating test data for the plurality of data registers. The pseudorandom global stimulus source generates a pseudorandom binary stimulus for the logic elements. At least some of the plurality of testing clusters are coupled together to support inter-cluster fan-out and fan-in of data register output.