The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Dec. 16, 2009
David Zeryck, Portland, OR (US);
Oufei Zhao, Needham, MA (US);
Weijing Song, Acton, MA (US);
Wolfgang Klinger, Whitinsville, MA (US);
John Freeman, Northbridge, MA (US);
Daniel Rice, Sturbridge, MA (US);
David Zeryck, Portland, OR (US);
Oufei Zhao, Needham, MA (US);
Weijing Song, Acton, MA (US);
Wolfgang Klinger, Whitinsville, MA (US);
John Freeman, Northbridge, MA (US);
Daniel Rice, Sturbridge, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
In an analyzer device, a method for identifying a logical unit (LUN) of a data storage system as a candidate for migration to a second storage group is presented. The method includes receiving, by the analyzer device, a set of data associated with activity of the LUN of a first storage group, comparing, by the analyzer device, a performance metric value of a performance metric of the set of data, associated with the LUN, to a performance metric threshold associated with the performance metric, and when the performance metric value corresponds to the performance metric threshold, categorizing, by the analyzer device, the LUN as a candidate for storage on the second storage group, the second storage group distinct from the first storage group and having a disk type different from that of the first storage group.