The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Aug. 10, 2007
Applicants:

Aaron A. Pesetski, Gambrills, MD (US);

Hong Zhang, Gambrills, MD (US);

John Xavier Przybysz, Severna Park, MD (US);

John Douglas Adam, Millersville, MD (US);

Inventors:

Aaron A. Pesetski, Gambrills, MD (US);

Hong Zhang, Gambrills, MD (US);

John Xavier Przybysz, Severna Park, MD (US);

John Douglas Adam, Millersville, MD (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/26 (2006.01); H04B 1/28 (2006.01);
U.S. Cl.
CPC ...
H04B 1/28 (2013.01);
Abstract

An imaging system includes an RF source, a focal plane array and device for focusing the RF signal from the RF source. The focal plane array includes a plurality of carbon nanotube mixers for capturing RF signals and down-converting the signals to a selected bandwidth and output an output signal. The device focuses the RF signal output from said RF source onto the focal plane array.


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