The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Oct. 18, 2010
Feng Tang, Mountain View, CA (US);
Suk Hwan Lim, Mountain View, CA (US);
Nelson Liang an Chang, San Jose, CA (US);
Feng Tang, Mountain View, CA (US);
Suk Hwan Lim, Mountain View, CA (US);
Nelson Liang An Chang, San Jose, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A local image patch identified in an image is divided into respective sub-patches of respective image forming elements. For each of the respective image forming elements in the local image patch, a respective ordinal rank of the image forming element is determined, and respective contributions of the image forming element to a particular one of the respective sub-patches containing the image forming element and to one or more other ones of the respective sub-patches neighboring the particular sub-patch are ascertained. Each ordinal rank corresponds to a respective dimension of an ordinal rank feature space. For each of the respective sub-patches of the local image patch, a respective histogram of ascertained contributions of the image forming elements in the ordinal rank feature space is built. A respective feature vector representing the local image patch is generated from the respective histograms built for the sub-patches of the local image.