The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Aug. 05, 2010
Alfons Abele, Schwaebisch Gmuend, DE;
Rupert Demleitner, Heidenheim, DE;
Daniel Kolster, Oberkochen, DE;
Alfons Abele, Schwaebisch Gmuend, DE;
Rupert Demleitner, Heidenheim, DE;
Daniel Kolster, Oberkochen, DE;
Carl Zeiss Surgical GmbH, , DE;
Abstract
An operating microscope has a main objective () that extends along an objective plane and is penetrated by a binocular main observer beam path and a binocular co-observer beam path. The binocular main observer beam path has two main observation pupils () in the objective plane with centers on a first straight line (). The binocular co-observer beam path has two co-observation pupils () in the objective plane with centers on a second straight line (). The first and second straight lines () intersect. The co-observer beam path can be displaced with respect to the main observer beam path so that the angle between the second and first straight line () changes. The center point () between the co-observation pupils () in the objective plane displaces when there is a change in the angle between the second and first imagined straight lines ().