The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Mar. 04, 2011
Applicants:

Shin-ichiro Tezuka, Musashino, JP;

Hitoshi Hara, Musashino, JP;

Inventors:

Shin-ichiro Tezuka, Musashino, JP;

Hitoshi Hara, Musashino, JP;

Assignee:

Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G02B 7/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A component measurement apparatus includes a laser that emits non-collimated laser light, an objective lens that condenses the non-collimated laser light emitted from the laser in order for the laser light to illuminate internal tissue of an object of measurement without collimating the laser light, a half mirror that redirects reflected light reflected by the internal tissue of the object of measurement and refracted by the objective lens, a pin hole through which the reflected light redirected by the half mirror passes, a light-receiving element that receives the reflected light having passed through a pin hole, and a data analyzer section that measures a component of the object of measurement in accordance with data output from the light-receiving element.


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