The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Feb. 26, 2009
Kazuyuki Sumi, Osaka, JP;
Manabu Hashimoto, Osaka, JP;
Masashi Inoue, Osaka, JP;
Yoshihiro Nishimura, Osaka, JP;
Kazuyuki Sumi, Osaka, JP;
Manabu Hashimoto, Osaka, JP;
Masashi Inoue, Osaka, JP;
Yoshihiro Nishimura, Osaka, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A method for detecting a foreign particle trapped between substrates of a liquid crystal display panel, by which a potential short caused by the particle can be made into a short with reliability, and thus it is possible to make a display defect manifest itself that is caused by the particle. The method is for detecting the presence of a foreign particle trapped between flexible substrates () of a liquid crystal display panel (), between the substrates liquid crystals filled, and the method includes making the panel pass between supporting rollers () arranged to support one surface of the panel, and a pressing roller () disposed at a position opposed to a space between the supporting units and arranged to press the other surface of the panel, bending the panel, and displacing the substrates with respect to each other in their surface directions.