The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Jul. 11, 2011
Ronaldo Francisco, Chandler, AZ (US);
Chi Lung Wong, Gilbert, AZ (US);
Tim Messang, Gilbert, AZ (US);
Ezana Haile Aberra, Chandler, AZ (US);
Ronaldo Francisco, Chandler, AZ (US);
Chi Lung Wong, Gilbert, AZ (US);
Tim Messang, Gilbert, AZ (US);
Ezana Haile Aberra, Chandler, AZ (US);
Microchip Technology Incorporated, Chandler, AZ (US);
Abstract
A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of the DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.