The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Jan. 26, 2010
Bekir S. Yilbas, Dhahran, SA;
Muhammad A. Hawwa, Dhahran, SA;
Shahzada Z. Shuja, Dhahran, SA;
King Fahd University of Petroleum & Minerals, Dhahran, SA;
Abstract
The apparatus and method for controlling laser cutting through surface plasma monitoring provides real-time monitoring and control of laser cutting quality. Laser cutting of a workpiece is controlled through monitoring of surface plasma generation, particularly during a laser gas-assisted cutting process. The apparatus includes a Langmuir probe positioned adjacent the impingement point of the laser beam on the workpiece. The Langmuir probe is in communication with a signal analyzer for measuring electrical voltage generated by plasma generated by the cutting of the workpiece. A controller is provided for comparing the measured electrical voltage with a desired threshold voltage. Control signals are generated to selectively adjust output power of the laser responsive to the compared measured electrical voltage and the desired threshold voltage to minimize plasma generation.