The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Jun. 01, 2010
Applicants:

Stefan Riebel, Bellheim, DE;

Bruno Robert Thoes, Qierschied, DE;

Manfred Augstein, Mannheim, DE;

Herbert Wieder, Mannheim, DE;

Gregor Bainczyk, Mannheim, DE;

Inventors:

Stefan Riebel, Bellheim, DE;

Bruno Robert Thoes, Qierschied, DE;

Manfred Augstein, Mannheim, DE;

Herbert Wieder, Mannheim, DE;

Gregor Bainczyk, Mannheim, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 99/00 (2010.01); G01N 15/06 (2006.01); G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system are disclosed. The analysis system provides an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and an electrical contact element which makes electrical contact with an electrical contact surface of an analytical test element to produce an electrical connection between the contact surface and the evaluation appliance. The contact element is moved by means such that contact with the electrical contact surface of the test element is made when the test element holder is in the measurement position.


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