The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Apr. 01, 2010
Applicant:

Hideki Tanaka, Tama, JP;

Inventor:

Hideki Tanaka, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endoscope shape analysis apparatus includes a coordinates obtaining portion for obtaining coordinate values of an insertion portion; a storage portion for storing the coordinate values; a straight line setting portion for setting a first straight line A and a second straight line B, based on the coordinate values; a coordinate transformation portion for transforming coordinates of a previous second straight line B, based on a positional relationship between a previous first straight line Aand the first straight line A, to calculate a third straight line B; a determination portion for determining whether there is an error in a position display from a positional relationship between the first straight line A, the second straight line B, and the third straight line B; and a correction portion for correcting the second straight line B.


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