The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Jan. 27, 2010
Applicants:

L. Michael Mckee, Friendswood, TX (US);

Robert Michael Ramsey, Missouri City, TX (US);

Hifzi Ardic, Sugar Land, TX (US);

Inventors:

L. Michael McKee, Friendswood, TX (US);

Robert Michael Ramsey, Missouri City, TX (US);

Hifzi Ardic, Sugar Land, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A well access line monitor. The monitor may be employed to directly interface and establish the current yield strength of a plastically deformable line such as coiled tubing or slickline. Such interfacing may take place in advance of, or during an application. Thus, the fitness of the line for the application may be established in real-time. Further, with comparison to a reference log of projected yield strength for the line over the course of multiple bend cycles, the remaining life of the line may also be established.


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