The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2013
Filed:
Mar. 27, 2009
Masaki Yamano, Osaka, JP;
Hiroshi Shikada, Osaka, JP;
Kenji Fujiwara, Osaka, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
An ultrasonic testing equipment includes an ultrasonic probe having a plurality of transducers arranged along a predetermined annular curved surface, a transmission/reception control unit that causes at least two transducers of the plurality of transducers to transmit the ultrasonic waves to and receive the same from a tubular test object and a ultrasonic testing waveform display unit which displays ultrasonic testing waveforms received by the selected transducers radially corresponding to the propagation directions of the ultrasonic waves transmitted from and received by the selected transducers. The waveform display unit displays the waveforms radially with a point of time corresponding to an echo on an incident point of the ultrasonic wave to the test object contained in the waveform as a beginning point and displays circles indicating points of time corresponding to the echo on the internal surface and/or the external surface of the test object around the beginning point.