The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Jan. 30, 2008
Applicants:

Eleazar Eskin, Santa Monica, CA (US);

Andrew Oliver Arnold, New York City, NY (US);

Michael Prerau, Chestnut Hill, MA (US);

Leonid Portnoy, Brooklyn, NY (US);

Salvatore J. Stolfo, Ridgewood, NJ (US);

Inventors:

Eleazar Eskin, Santa Monica, CA (US);

Andrew Oliver Arnold, New York City, NY (US);

Michael Prerau, Chestnut Hill, MA (US);

Leonid Portnoy, Brooklyn, NY (US);

Salvatore J. Stolfo, Ridgewood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/14 (2006.01); G06F 12/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for unsupervised anomaly detection, which are algorithms that are designed to process unlabeled data. Data elements are mapped to a feature space which is typically a vector space. Anomalies are detected by determining which points lies in sparse regions of the feature space. Two feature maps are used for mapping data elements to a feature apace. A first map is a data-dependent normalization feature map which we apply to network connections. A second feature map is a spectrum kernel which we apply to system call traces.


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