The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Oct. 28, 2011
Eng Ling Ho, Seberang Jaya, MY;
Chai Ling Chee, Jalan Van Praagh, MY;
Eng Ling Ho, Seberang Jaya, MY;
Chai Ling Chee, Jalan Van Praagh, MY;
Altera Corporation, San Jose, CA (US);
Abstract
An apparatus to test a parametric structure utilizing a logical sensing technique is provided. The apparatus includes a device under test (DUT) and tester hardware. The DUT includes a parametric structure that receives a logic signal and transfers the logic signal through the parametric structure to a power pin that is coupled to the parametric structure. The DUT also includes a DFT circuitry that controls a pathway connecting the parametric structure and the power pin. The DFT circuitry gates the logic signal propagation from the parametric structure to the power pin. The tester hardware includes a channel to transfer or receive a logic signal and a power pathway to transfer power to the DUT. The tester hardware also includes a switch to multiplex the power pathway or the channel connections to the power pin.