The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Dec. 28, 2010
Applicants:

Chuan-wei Ting, Kaohsiung, TW;

Ching-yao Wang, Guiren Township, TW;

Inventors:

Chuan-Wei Ting, Kaohsiung, TW;

Ching-Yao Wang, Guiren Township, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present application discloses a method of detecting abnormal movement of a physical object. A periodic signal is representative of the movement of the object. According to some embodiments, a raw matrix having a first array and a second array is generated, and then an integrated matrix is generated by performing a dimension reduction on the raw matrix. A likelihood of a predetermined type of abnormal movement of the physical object is determined by comparing the integrated matrix with a predetermined benchmark pattern. In some embodiments, the generation of the raw matrix includes performing a first analysis on a predetermined portion of the periodic signal to generate the first array and performing a second analysis different from the first analysis on the predetermined portion of the periodic signal to generate the second array.


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