The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Mar. 17, 2011
Applicant:

Yuusuke Ishizaki, Kanagawa, JP;

Inventor:

Yuusuke Ishizaki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A load abnormality detection apparatus detects a load abnormality in at least one of a first rotational member and a second rotational member. An element acquisition part acquires a first control element and a second control element. A first comparison part compares the first control element with a first threshold value and also compares the first control element with a second threshold value larger than the first threshold value. A second comparison part compares the second control element with a third threshold value and also compares the second control element with a fourth threshold value larger than the third threshold value. An abnormality detection part detects a load abnormality in a load applied to at least one of the first and second rotational members based on results of comparison by the first comparison part and the second comparison part and identifies a cause of the detected load abnormality.


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