The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2013

Filed:

Dec. 16, 2011
Applicants:

Mark Bathe, Cambridge, MA (US);

Jun He, San Diego, CA (US);

Syuan-ming Guo, Cambridge, MA (US);

Nilah Monnier, Brookline, MA (US);

Inventors:

Mark Bathe, Cambridge, MA (US);

Jun He, San Diego, CA (US);

Syuan-Ming Guo, Cambridge, MA (US);

Nilah Monnier, Brookline, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for inferring particle dynamics from certain data include determining multiple models for motion of particles in a biological sample. Each model includes a corresponding set of one or more parameters. Measured data is obtained based on measurements at one or more voxels of an imaging system sensitive to motion of particles in the biological sample; and, determining noise correlation of the measured data. Based at least in part on the noise correlation, a marginal likelihood is determined of the measured data given each model of the multiple models. A relative probability for each model is determined based on the marginal likelihood. Based at least in part on the relative probability for each model, a value is determined for at least one parameter of the set of one or more parameters corresponding to a selected model of the multiple models.


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